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Beilstein J. Nanotechnol. 2013, 4, 501–509, doi:10.3762/bjnano.4.59
Figure 1: Schematic view of the spatial intensity distribution at the surface of a crystalline Si substrate i...
Figure 2: Scheme of the experimental set-up used for sample irradiation and fs-resolved microscopy. (IF) inte...
Figure 3: Surface reflectivity images of a particle-free c-Si surface exposed to a 120 fs laser pulse for dif...
Figure 4: Normalized reflectivity as a function of delay measured for a particle-free, c-Si surface, at the c...
Figure 5: (a) Calculated near field distribution at the surface of a Si substrate for a SiO2 dielectric parti...
Figure 6: Surface reflectivity images at the particle location for different time delays, upon exposure to a ...
Figure 7: Surface reflectivity images at the particle location for two different delays (indicated), upon exp...